Effect of external magnetic field on the K beta/K alpha X-ray intensity ratios of TixNi1-x alloys excited by 59.54 and 22.69 keV photons

摘要

The effects of external magnetic field and exciting photon energies on the K beta/K alpha X-ray intensity ratios of various alloy compositions of Ti-Ni transition metal alloys have been investigated in this work using X-ray fluorescence spectroscopy. The spectrum of characteristic K-X-ray photons from pure Ti, pure Ni and TixNi1-x (x=030; 0.40; 0.50; 0.60; 0.70) alloys were detected with a high resolution Si (Li) solid-state detector. Firstly, K beta/K alpha X-ray intensity ratios of pure Ti, pure Ni and TixNi1-x alloys were measured following excitation by 59.54 keV gamma-rays from a 200 mCi Am-241 radioactive point source without any magnetic field and under 0.5 and 1 T external magnetic fields, separately. Later, the same measurements were repeated under the same experimental conditions for 22.69 keV X-rays from a 370 MBq(109)Cd radioactive point source. The results obtained for K beta/K alpha X-ray intensity ratios of pure Ti, pure Ni, Ti and Ni in various Ti-Ni alloys were evaluated in terms of both external magnetic field effect and exciting photon energy effect. When the results obtained for both exciting photon energies are evaluated in terms of changing of K beta/K alpha X-ray intensity ratios depending on the alloy composition, the tendency of these changes are observed to be similar. Also, K beta/K alpha X-ray intensity ratios for all samples examined have changed with increasing external magnetic field. Therefore, the results obtained have shown that K beta/K alpha X-ray intensity ratios of Ti and Ni in TixNi1-x alloys are connected with the external magnetic field. The present study makes it possible to perform reliable interpretation of experimental K beta/K alpha X-ray intensity ratios for Ti, Ni and TixNi1-x alloys and can also provide quantitative information about the changes of the K beta/K alpha X-ray intensity ratios of these metals with alloy composition. (C) 2016 Elsevier Ltd. All rights reserved.