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机译:中红外光谱衍射限制通过光热光谱分析的直接测量效果
NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA;
Anasys Instruments Inc, Santa Barbara, CA 93101 USA;
Atomic Force Microscopy; Photothermal effects; SpectrographyDIRECT METERINGMID-INFRARED SPECTROSCOPYInfrared radiationLimitthermal mappingPathway;
机译:Efficiency-enhanced和sidelobe-suppressedsuper-oscillatory镜头对sub-diffraction-limit荧光成像技术与超长的工作距离
机译:H-2 Chemical-shift resolution and dipolar H-2-H-1, H-2-N-15 correlations in solid-state mas NmR spectroscopy for structure determination and distance measurements in hydrogen-bonded systems