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Unique Degradation Signatures of Organic Solar Cells with Nonfullerene Electron Acceptors

机译:具有非氟伦烯电子受体的有机太阳能电池的独特降解特征

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We investigate the degradation phenomena of organic solar cells based on nonfullerene electron acceptors (NFA) using intensity-modulated photocurrent spectroscopy (IMPS). Devices composed of NIR absorbing blends of a polymer (PTB7) and NFA molecules (COi8DFIC) were operated in air for varying periods of time that display unusual degradation trends. Light aging (e.g., ~3 days) results in a characteristic first quadrant (positive phase shifts) degradation feature in IMPS Nyquist (Bode) plots that grow in amplitude and frequency with increasing excitation intensity and then subsequently turns over and vanishes. By contrast, devices aged and operated in air for longer times (>5 days) display poor photovoltaic performance and have a dominant first quadrant IMPS component that grows nonlinearly with excitation intensity. We analyze these degradation trends using a simple model with descriptors underlying the first quadrant feature (i.e., trap lifetime and occupancy). The results indicate that the quasi first-order recombination rate constant, k _(rec), is significantly slower in addition to lower trap densities in devices exhibiting light aging effects that are overcome by increasing carrier densities (viz. excitation intensity). By contrast, larger trap densities and distributions coupled with larger k _(rec) values are found to be responsible for the continuous growth of the first quadrant with light intensity. We believe that defect formation and charge recombination at device contact interfaces is chiefly responsible for performance degradation, which offers several directions for materials and device optimization strategies to minimize long-term detrimental factors.
机译:我们使用强度调制光电流谱(IMPS)研究了基于非富勒烯电子受体(NFA)的有机太阳能电池的降解现象。由聚合物(PTB7)和NFA分子(COi8DFIC)的近红外吸收混合物组成的装置在空气中运行了不同的时间段,显示出异常的降解趋势。光老化(例如,~3天)导致IMPS-Nyquist(Bode)图中的特征第一象限(正相移)退化特征,其振幅和频率随着激发强度的增加而增加,然后翻转并消失。相比之下,老化并在空气中运行更长时间(>5天)的设备显示出较差的光伏性能,并且具有占主导地位的第一象限IMPS组件,该组件随激发强度非线性增长。我们使用一个简单的模型来分析这些退化趋势,模型中的描述符是第一象限特征(即陷阱寿命和占用率)的基础。结果表明,在具有光老化效应的器件中,除了较低的陷阱密度外,准一级复合速率常数k_rec(rec)也明显较慢,这可以通过增加载流子密度(即激发强度)来克服。相比之下,更大的陷阱密度和分布以及更大的k(rec)值被发现是第一象限随光强持续增长的原因。我们认为,器件接触界面处的缺陷形成和电荷复合是性能退化的主要原因,这为材料和器件优化策略提供了几个方向,以尽量减少长期有害因素。

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