首页> 外文期刊>Journal of surface investigation: x-ray, synchrotron and neutron techniques >Channeling of Charged Particles Near the Surface of Semiconductors and Conducting Crystals
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Channeling of Charged Particles Near the Surface of Semiconductors and Conducting Crystals

机译:通道半导体表面附近的带电粒子和导电晶体

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摘要

The features of the orientational motion and channeling of charged particles are considered. They move in a near-surface potential well whose structure is formed by the surface plane of a crystal and by the action of the vector potential of the electric current flowing through a crystal or along a conductor, near which a nonconducting crystal is located. The width of the potential well forming the near-surface channeling mode depends on the crystal thickness and the electric current density and can vary in the range from several millimeters to a few micrometers as the current density varies in the range of 1-1000 A/cm(2). The process of near-surface channeling in the field of a plane conductor with current provides the abnormally weak deceleration of particles and can be used to transport particle beams along conductors with current over large distances. A similar axial channeling mode is characterized by the complete suppression of the scattering and deceleration of ion beams during their motion in free space along the surface of a cylindrical conductor with current.
机译:考虑了带电粒子的取向运动和沟道特征。它们在一个近表面势阱中移动,该势阱的结构由晶体的表面平面和流经晶体或沿导体的电流矢量势的作用形成,导体附近有一个非导电晶体。形成近表面沟道模式的势阱的宽度取决于晶体厚度和电流密度,当电流密度在1-1000 a/cm(2)范围内变化时,它可以在几毫米到几微米的范围内变化。在有电流的平面导体场中,近表面沟道的过程提供了粒子异常微弱的减速,并可用于沿有电流的导体远距离传输粒子束。类似的轴向沟道模式的特点是,离子束在自由空间中沿有电流的圆柱形导体表面运动时,其散射和减速受到完全抑制。

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