A method for obtaining 3D images of a sample by detecting scattered X rays with a pinhole camera

摘要

A method for studying the internal structure of a sample by detecting scattered synchrotron radiation using a pinhole camera is considered. The beam for imaging is shaped like a plane that intersects the sample. The characteristic spatial resolution of the method is 100 mu m. Examples of the obtaining of images are presented, and the differences of this method from traditional techniques are discussed.