Application of wavelet transform to background correction in inductively coupled plasma atomic emission spectrometry

摘要

A background correction method based on wavelet transform was devised and applied to inductively coupled plasma atomic emission spectrometry (ICP-AES). The proposed approach separated background from analyte signal according to their different frequencies. Compared with the analyte signal, the background has a low frequency. By removal of the components attributed to the signal, the background over the spectral window of the analyte line can be fitted through wavelet reconstruction. The results showed that the wavelet transform technique could handle all kinds of background and low signal-to-background ratio spectra, and required no prior knowledge about the sample composition, no selection of suitable background correction points, and no mathematical assumption of the background distribution. This technique performed as well as the conventional three-point background correction method for linear backgrounds, and provided better results than the latter for curved backgrounds. The proposed procedure was illustrated, by processing real spectra, to be an effective and practical tool for background correction in ICP-AES.