An image-mapped detector for simultaneous ICP-AES

摘要

A W-sensitive, image-mapped detector utilizing state-of-the-art charge-coupled device technology was designed for use with an echelle spectrometer for a simultaneous inductively coupled plasma atomic emission spectrometer system. The image-mapped detector consists of 70 diagonalized linear arrays (DLA) of photoactive picture elements (pixels) arranged to match exactly the angle and the curvature of each individual diffraction order in the image focal plane of the spectrometer. Each DLA is designed to have a length that matches the length of the free spectral range of the order that it tracks, resulting in exceptionally broad wavelength coverage of the spectrum of interest using more than 70 000 pixels. Each of the DLA transfer registers is further divided into two half-registers with separate read electronics to double the readout speed of the device. The readout and related charge-transfer circuitry is positioned between the arrays of photosensitive pixels, in the area where no spectral information Mill exist. Each of the 140 DLA transfer half-registers has its own dedicated amplification and final readout circuits at the end of each half-register. This arrangement allows for independent control of integration time within each DLA and greatly enhances its linear dynamic range as a simultaneous detection system, The extensive wavelength coverage and large dynamic range, coupled with superior deep ultraviolet sensitivity and extremely fast readout, make this image-mapped device an ideal detector for emission spectroscopy. [References: 7]