Field-Emission Cold-Cathode El Source for a Microscale Ion Trap Mass Spectrometer

摘要

A cold-cathode electron impact ionization source based on field emission from an array of diamond-coated silicon whiskers is described. The source is coupled to a microscale ion trap mass spectrometer (r_(0)=0.50 mm, z_(0)=0.50 mm). An electron beam of 250 nA could be obtained through the 0.45-mm diameter opening in the end cap electrode.