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Surface chemistry of TiO2-ZnO thin films doped with Ag. Its role on the photocatalytic degradation of methylene blue

机译:TiO2-ZnO薄膜的表面化学掺杂有Ag。 它对亚甲基蓝光催化降解的作用

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Photocatalytic Ag-loaded (TiO2)(0.95)-(ZnO)(0.05) thin films were synthesized by the sol-gel dip-coating method, with the Ag content varying in the range 1-4 mol%. The films were deposited on glass substrates at room temperature and then annealed at 500 degrees C. Raman spectroscopy disclosed basically the anatase phase of TiO2. Secondary ion mass spectrometry measurements proved the incorporation of Ag in the films, revealing its diffusion to the film surface as a consequence of thermal treatments. X-ray photoelectron spectroscopy (XPS) was used to study in detail the chemical composition and electronic structure of the samples. The O 1s, Ti 2p, and Zn 2p core level spectra indicated Ti4+ and Zn2+ states associated with TiO2 and ZnO regions. The chemical species identification was confirmed by calculating the modified Auger parameter for O, Ti, and Zn. In addition, an XPS depth profile analysis using an Ar+ ion gun showed the formation of Ti+2 and Ti+3 oxidation states as a consequence of the Ar+ bombardment. The photocatalytic activity under UV irradiation was evaluated by the degradation of methylene blue aqueous solutions, with the best response corresponding to (TiO2)(0.95)-(ZnO)(0.05) thin films doped with 2 mol% Ag.
机译:采用溶胶-凝胶浸涂法制备了载银(TiO2)(0.95)-(ZnO)(0.05)的光催化薄膜,其Ag含量在1-4 mol%范围内变化。薄膜在室温下沉积在玻璃衬底上,然后在500℃下退火。拉曼光谱基本上揭示了TiO2的锐钛矿相。二次离子质谱测量证实了银在薄膜中的掺入,揭示了热处理导致银扩散到薄膜表面。用X射线光电子能谱(XPS)详细研究了样品的化学组成和电子结构。O 1s、Ti 2p和Zn 2p核心能级光谱表明Ti4+和Zn2+状态与TiO2和ZnO区域有关。通过计算O、Ti和Zn的修正俄歇参数,确认了化学物种识别。此外,使用Ar+离子枪进行的XPS深度剖面分析表明,Ti+2和Ti+3氧化态的形成是Ar+轰击的结果。通过降解亚甲基蓝水溶液来评估紫外光照射下的光催化活性,最佳响应对应于掺杂2 mol%Ag的(TiO2)(0.95)-(ZnO)(0.05)薄膜。

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