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Reconstruction method of axisymmetric refractive index fields with background-oriented schlieren

机译:轴对称折射率场与背景为导向的Schlieren重建方法

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摘要

A refractive index field can be quantitatively visualized by using a background-oriented schlieren (BOS) technique to measure the displacements of background dot patterns of a 2D image captured by a camera. In BOS, the displacement is caused by the deflection of the light ray passing through the refractive index field. However, obtaining depth information of refractive index fields is often difficult because dot-pattern displacement results from deflection of light rays integrated over their path. A method of reconstructing depth information of the refractive index field using an inverse matrix method with the BOS technique is proposed here under the assumption of an axisymmetric refractive index field. A field, generated by laser irradiation inside a glass, is reconstructed by the proposed method and is also theoretically calculated using the heat diffusion equation and thermal stress theory. The reconstructed field agrees well with the theoretically calculated one, which validates the proposed method. The proposed method is a promising candidate for measuring axisymmetric refractive index fields of various media. (C) 2018 Optical Society of America
机译:可以通过使用背景取向的Schlieren(BOS)技术来定量可视化折射率字段,以测量由相机捕获的2D图像的背景点图案的位移。在BOS中,位移是由通过折射率场的光线的偏转引起的。然而,获得折射率字段的深度信息通常很困难,因为点图案位移导致集成在其路径上的光线的偏转。在此,在轴对称折射率场的假设下,提出了使用具有BOS技术的反向矩阵法重建折射率场的深度信息的方法。由玻璃内的激光照射产生的磁场,由所提出的方法重建,并且也使用热扩散方程和热应力理论理论地计算。重建的领域与理论上计算的字段吻合良好,验证了所提出的方法。所提出的方法是用于测量各种介质的轴对称折射率场的有希望的候选者。 (c)2018年光学学会

著录项

  • 来源
    《Applied optics》 |2018年第30期|共8页
  • 作者

    Ohno Hiroshi; Toya Kiminori;

  • 作者单位

    Toshiba Co Ltd Corp Res &

    Dev Ctr Saiwai Ku Komukai Toshiba Cho Kawasaki Kanagawa 2128582 Japan;

    Toshiba Co Ltd Corp Mfg Engn Ctr Isogo Ku 33 Shin Isogo Cho Yokohama Kanagawa 2350017 Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
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