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Study on a peak shape fitting model for the analysis of alpha-particle spectra

机译:α-粒子光谱分析峰形拟合模型的研究

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摘要

In this study it is developed a model for the detailed and automatic study of the alpha-particle spectra coming from detection systems. The fitting of a typical shape of the alpha peak is performed by a Gaussian function for the right side of the peak and a sum of two Gaussian functions for its left tail. The model takes into account the entire spectrum background and, particular attention is posed to the analysis of overlapped peaks, background noise and peaks with low statistic counting. The effectiveness of the proposed model is supported by several tests.
机译:在这项研究中,它开发了一种用于来自检测系统的α-粒子光谱的详细和自动研究的模型。 α峰的典型形状的拟合由峰的右侧的高斯函数和其左尾的两个高斯函数的总和进行。 该模型考虑了整个频谱背景,并且特别关注重叠峰值,背景噪声和具有低统计计数的峰值的分析。 拟议模型的有效性得到了多次测试的支持。

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