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首页> 外文期刊>Analytica chimica acta >The use of infrared spectroscopic techniques to characterize nanomaterials and nanostructures: A review
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The use of infrared spectroscopic techniques to characterize nanomaterials and nanostructures: A review

机译:使用红外光谱技术表征纳米材料和纳米结构:综述

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摘要

Recent advances in nanotechnology have opened a lot of new possibilities for nanomaterials application in wide variety of industrial, pharmaceutical, medicinal and environmental applications. This review aims to description of various Fourier Transform Infrared (FTIR)-based spectroscopic techniques suitable to characterize (i) different types of nanomaterials and (ii) various macroscopic samples at their nanoscale. In the introductory section, nanomaterials are classified according to their crucial properties, i.e. chemical composition, size and surface morphology. Application of traditional FTIR techniques, such as Attenuated Total Reflection (ATR), Diffuse Reflection (DRIFT) and infrared micro (spectro)scopy, for characterization of nanomaterials and nanostructures is compared with novel optical nanoscopic techniques derived from scanning probe microscopy which enable to overcome the diffraction limit and to characterize nanomaterials at molecular scale.
机译:纳米技术最近的进展在各种工业,制药,药用和环境应用中,纳米材料应用已经开辟了许多新的可能性。 该审查旨在描述各种傅里叶变换红外(FTIR)基础的光谱技术,适用于表征(i)不同类型的纳米材料和(ii)在其纳米级上的各种宏观样品。 在介绍部分中,纳米材料根据其关键性质进行分类,即化学成分,大小和表面形态。 将传统FTIR技术的应用,例如衰减的全反射(ATR),漫反射(漂移)和红外微(光谱微(光谱)和红外微(光谱)与纳米材料和纳米结构的表征进行比较,与扫描探针显微镜衍生的新型光学纳米镜技术进行比较,这使得能够克服 衍射极限并以分子尺度表征纳米材料。

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