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Validation of Single Particle ICP-MS for Routine Measurements of Nanoparticle Size and Number Size Distribution

机译:验证单粒子ICP-MS,用于纳米粒子尺寸和数量尺寸分布的常规测量

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摘要

Single particle inductively coupled plasma mass spectrometry (spICP-MS) is an emerging technique capable of simultaneously measuring nanoparticle size and number concentration of metal-containing nanoparticles (NPs) at environmental levels. single particle ICP-MS will become an established measurement method once the metrological quality of the measurement results it produces have been proven incontrovertibly. This Article presents the first validation of spICP-MS capabilities for measuring mean NP size and number size distribution of gold nanoparticles (AuNPs). The validation is achieved by (i) calibration based on the consensus value for particle size derived from six different sizing techniques applied to National Institute of Standards and Technology (NIST) Reference Material (RM) 8013; (ii) comparison with high-resolution scanning electron microscopy (HR-SEM) used as a reference method, which is linked to the International System of Units (SI) through a calibration standard characterized by the NIST metrological atomic force microscope; and (iii) evaluation of the uncertainty associated with the measurement of the mean particle size to enable comparison of the spICP-MS and HR-SEM methods. After establishing HR-SEM and spICP-MS measurement protocols, both methods were used to characterize commercial AuNP suspensions of three different sizes (30, 60, and 100 nm) with four different coatings and surface charge at pH 7. Single particle ICP-MS measurements (corroborated by HR-SEM) revealed the existence of two distinct subpopulations of particles in the number size distributions for four of the 60 nm commercial suspensions, a fact that was not apparent in the measurement results supplied by the vendor using transmission electron microscopy. This finding illustrates the utility of spICP-MS for routine characterization of commercial AuNP suspensions regardless of size or coating.
机译:单颗粒电感耦合等离子体质谱(SPICP-MS)是能够在环境水平同时测量纳米颗粒尺寸和数量纳米颗粒(NPS)的纳米颗粒尺寸和数量浓度的新兴技术。单粒子ICP-MS将成为一项建立的测量方法,一旦它产生的测量结果的计量质量已被证明是可疑的。本文介绍了SPICP-MS功能的第一次验证,用于测量金纳米颗粒(AUNP)的平均NP大小和数量尺寸分布。通过(i)校准基于应用于国家标准和技术研究所(NIST)参考资料(RM)8013的六种不同尺寸技术的粒度共识值来实现验证(ii)与用作参考方法的高分辨率扫描电子显微镜(HR-SEM)的比较,该参考方法通过NIST计量原子力显微镜特征的校准标准与国际单位系统(SI)连接; (iii)评估与测量平均粒径的不确定性,以实现SPICP-MS和HR-SEM方法的比较。在建立HR-SEM和SPICP-MS测量方案之后,两种方法用于表征三种不同尺寸(30,60和100nm)的商业AUNP悬浮液,其在pH 7处具有四种不同的涂层和表面电荷。单粒子ICP-MS测量(通过HR-SEM证实)揭示了在60nm商业悬浮液中的四种中的数量分布中存在两个不同的颗粒亚群,这是在供应商使用透射电子显微镜提供的测量结果中不明显的事实。该发现说明了SPICP-MS的效用,用于商业AUNP悬浮液的常规表征,无论尺寸还是涂层。

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