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首页> 外文期刊>Chemical engineering journal >Adsorptive separation of xenon/krypton mixtures using ligand controls in a zirconium-based metal-organic framework
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Adsorptive separation of xenon/krypton mixtures using ligand controls in a zirconium-based metal-organic framework

机译:用配体对照在基于锆的金属有机框架中使用配体对照的吸附分离

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摘要

A Zr-based metal-organic framework (MOF), UiO-66, is considered to be one of the most stable MOFs and has recently been shown to be a good candidate for adsorptive separation of Xe/Kr mixtures. Since the ability to impart chemical functionalities is an attractive characteristic of MOFs, herein, we prepared a series of functionalized UiO-66 materials (UiO-66-NH2, UiO-66-(OMe) 2, UiO-66-NH2(OMe)(2), and UiO-66-F-4) by incorporating several polar functionalities into UiO-66. We found that series of electron-rich and electron-deficient UiO-66 materials have stronger interactions with Xe and Kr atoms than pristine UiO-66. We also found that Xe/Kr selectivity increases with the electron density of the ligand. Although there was a reduction in surface area, UiO66- NH2(OMe) 2 exhibited the highest Xe/Kr Henry's constant ratio (14.4), possibly due to having the highest electron density as well as an unsymmetrical arrangement of functional groups of the ligands. Furthermore, the breakthrough experiments show that UiO-66-NH2(OMe)(2) can effectively separate Xe from Kr under dynamic mixture conditions and can be easily regenerated under a mild regeneration condition.
机译:基于Zr的金属 - 有机框架(MOF),UIO-66被认为是最稳定的MOF之一,并且最近已被证明是XE / KR混合物的吸附分离的良好候选者。由于赋予化学功能的能力是MOF的有吸引力的特征,在此,我们制备了一系列官能化的UIO-66材料(UIO-66-NH2,UIO-66-(OME)2,UIO-66-NH2(OME) (2)和UIO-66-F-4)通过将几种极性函数掺入UIO-66中。我们发现一系列富含电子和电子缺陷的UIO-66材料具有比原始UIO-66更强与Xe和Kr原子的相互作用。我们还发现XE / KR选择性随着配体的电子密度而增加。尽管表面积的降低了,但是UIO66-NH2(OME)2表现出最高的XE / KR亨利的恒定比(14.4),可能是由于具有最高的电子密度以及配体的官能团的不对称布置。此外,突破性实验表明,UIO-66-NH2(OME)(2)可以在动态混合物条件下有效地将XE与KR分开,并且可以在温和的再生条件下容易地再生。

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