High dielectric and microwave absorption properties of ultra-thin 1-xSrTiO(3-delta) - xSrAl(12)O(19) films

摘要

To reduce the thickness of the microwave absorbing materials, we have prepared 1-xSrTiO(3-delta) - xSrAl(12)O(19) ceramics by hot - pressing sintering in the vacuum. The microstructure, dielectric, thermogravimetric analysis and microwave absorbing properties of 1-xSrTiO(3-delta) - xSrAl(12)O(19) were systematically investigated and discussed. The 0.95SrTiO(3-delta)- 0.05SrAl(12)O(19) has high permittivity, the real part is from 1662.2 to 704.9 and the imaginary part is from 208.6 to 12. The absorption bandwidth (reflection loss = -5 dB) of 0.95SrTiO(3-delta) - 0.05SrAl(12)O(19) can cover 8.6 - 12.4 GHz and its thickness is only 0.232 mm which is much thinner than these recently reported by other researchers. For 0.95SrTiO(3-delta) - 0.05SrAl(12)O(19), the peak value of reflection loss is up to - 58.5 dB with a thickness of 0.75 mm. The 1-xSrTiO(3-delta) - xSrAl(12)O(19) films could be excellent candidates for highly efficient and ultra-thin microwave absorbing materials.