Effect of diffraction vectors noncoplanarity on characteristics of two-crystal oscillating curves

摘要

The possibility of the account of diffraction vectors noncoplanarity effect on characteristics of oscillating curve under crystal defects analysis when widening cause due to defects, comparable with hardware is shown. Formulas for calculation of half-width of oscillating curve under noncoplanarity of sample diffraction vectors and monochromator are presented. Results of measurements on an example of silicon carbide well coincide with settlement as at the analysis of reflections from planes with a small deviation from crystal surface, and at the analysis of asymmetric reflections, in particular at difractometric analysis of laminary lines.