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首页> 外文期刊>レ-ザ-研究 >A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser
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A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser

机译:一种通过激光干扰测量膜厚度的实用系统,与Laminar样激光器

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摘要

A practical system for measuring a film thickness based on laser interferometry has been constructed using a laminar-like laser and a CCD camera. The system can measure a film thickness at a measuring frequency of 50 Hz, which enables real-time measurement in practical use. The measurable minimum thickness by means of a blue laser having a wavelength of 405 nm was 2.4 mm, and the maximum thickness was 1.2 mm for a film with a refractive index of 1.4. The measurement error of the film thickness due to the spherical aberration of the cylindrical lens was Dh/h = 2% at maximum, where h expresses film thickness and Dh its error amount.
机译:用于测量基于激光干涉测定的膜厚度的实用系统,使用层状激光和CCD相机构造。 系统可以以50 Hz的测量频率测量膜厚度,这使得在实际使用中可以实时测量。 借助于波长为405nm的蓝色激光的可测量的最小厚度为2.4mm,折射率为1.4的薄膜的最大厚度为1.2mm。 由于圆柱形晶状体的球面像差导致的膜厚度的测量误差最大为DH / H = 2%,其中H表示膜厚度和DH误差量。

著录项

  • 来源
    《レ-ザ-研究》 |2004年第7期|共5页
  • 作者单位

    Department of Information Science Faculty of Engineering University of Fukui 3-9-1 Bunkyo Fukui 910-0017;

    Department of Electronics and Information Engineering Fukui National College of Technology Geshi Sabae Fukui 916-8507;

    North Tec. Co. Ltd. 3-24-16 Ninomiya Fukui 910-0015;

    Department of Information Science Faculty of Engineering University of Fukui 3-9-1 Bunkyo Fukui 910-0017;

    Department of Human Ecology and Technology Faculty of Education and Regional Studies University of Fukui 3-9-1 Bunkyo Fukui 910-0017;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 jpn
  • 中图分类 光学;
  • 关键词

    Measuring system; Film thickness; Interferometery; Laminar-like laser;

    机译:测量系统;薄膜厚度;干涉仪;层状激光;

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