Multi-diagnostic setup to investigate the two-close-frequency phenomena

摘要

While the mechanism is still not fully clear, the beneficial effect (higher intensity of highly charged ions, stable plasma conditions) of the second microwave injected to the ECR plasma was observed in many laboratories, both with close and far frequencies. Due to the complexity of the phenomena (e.g. interaction of resonant zones, damped instabilities) complex diagnostic methods are demanded to understand its mechanism better and to fully exploit the potential hidden in it. It is a challenging task since complex diagnostics methods require the arsenal of diagnostic tools to be installed to a relatively small size plasma chamber. Effect of the injected second 13.6-14.6 GHz microwave to the 14.25 GHz basic plasma has been investigated by means of soft and (time-resolved) hard X-ray spectroscopy, by X-ray imaging and space-resolved spectroscopy and by probing the rf signals emitted by the plasma. Concerning the characterization of the X radiation, in order to separate the source and position of different X-ray photons special metallic materials for the main parts of the plasma chamber were chosen. A detailed description and explanation of the full experimental setup and the applied non-invasive diagnostics tools and its roles are presented in this paper.