首页> 外文期刊>Journal of Experimental and Theoretical Physics >Magnetic anisotropy of epitaxial iorn films on single-crystal MgO(001) and Al_2O_3(1120) substrates
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Magnetic anisotropy of epitaxial iorn films on single-crystal MgO(001) and Al_2O_3(1120) substrates

机译:单晶MgO(001)和AL_2O_3(1120)基板上的外延毛膜的磁各向异性

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摘要

The ferromagnetic resonance and magnetization of single-crystal thin (27-100 A films grown in the (110) direction are measured in the temperature range 20-400 K. The films are prepared by molecular-beam epitaxy on single-crystal sapphire Al_2O_3(1120) substrates with a Nb(110) buffer layer. The angular dependence of the parameters of the ferromagnetic resonance spectrum is observed to have a 180 deg character when the static magnetic field is rotated in the plane of the sample. It is established that this angular dependence can be described on the assumption that the lattice distortions are essentially trigonal. A comparative analysis of previous data for Fe(001) films with the data for Fe (110) films shows that the source of the corrections to the cubic anisotropy constant is the characteristic distribution of the strains along the thickness of the film.
机译:单晶硅的铁磁共振和磁化(27-100在(110)方向上生长的薄膜在20-400k的温度范围内测量。通过单晶蓝宝石Al_2O_3的分子束外延制备薄膜( 1120)具有Nb(110)缓冲层的基板。当静磁场在样品平面中旋转时,观察到铁磁谐振谱的参数的角度依赖性具有180°的特征。建立了这一点 假设晶格失真基本上是三角的假设可以描述角度依赖性。Fe(001)膜与Fe(110)膜数据的先前数据的比较分析表明,对立方各向异性常数的校正源是 沿薄膜厚度的菌株的特征分布。

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