首页> 外文期刊>ZAMP: Zeitschrift fur Angewandte Mathematik und Physik: = Journal of Applied Mathematics and Physics: = Journal de Mathematiques et de Physique Appliquees >Three-dimensional analytical solution for the instability of a parallel array of mutually attracting identical simply supported piezoelectric microplates
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Three-dimensional analytical solution for the instability of a parallel array of mutually attracting identical simply supported piezoelectric microplates

机译:用于平行阵列的相互吸引相同的压电微孔板的三维分析解决方案

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摘要

Three-dimensional analytical solutions are derived for the structural instability of a parallel array of mutually attracting identical simply supported orthotropic piezoelectric rectangular microplates by means of a linear perturbation analysis. The two surfaces of each plate can be either insulating or conducting. By considering the fact that the shear stresses and the normal electric displacement (or electric potential) are zero on the two surfaces of each plate, a 2 x 2 transfer matrix for a plate can be obtained directly from the 8 x 8 fundamental piezoelectricity matrix without resolving the original Stroh eigenrelation. The critical interaction coefficient can be determined by solving the resulting generalized eigenvalue problem for the piezoelectric plate array. Also considered in our analysis is the in-plane uniform edge compression acting on the four sides of each piezoelectric plate. Our results indicate that the stabilizing influence of the piezoelectric effect on the structural instability is unignorable; the edge compression always plays a destabilizing role in the structural instability of the plate array with interactions.
机译:通过线性扰动分析导出用于通过线性扰动分析的平行阵列的平行阵列的结构不稳定性来得出三维分析溶液。每个板的两个表面可以是绝缘或导电。通过考虑每个板的两个表面上的剪切应力和正常电位(或电势)为零,可以直接从8×8基本压电基质中获得2×2转移矩阵而没有解决原始的stroh特征曲线。可以通过求解压电板阵列的所产生的广义特征值问题来确定临界相互作用系数。在我们的分析中也考虑是在每个压电板的四边的面内均匀边缘压缩。我们的结果表明,压电效应对结构不稳定性的稳定性影响是不垂起的;边缘压缩始终在具有相互作用的板阵列的结构不稳定性中起稳定的作用。

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