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首页> 外文期刊>Journal of Applied Crystallography >In-house texture measurement using a compact neutron source
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In-house texture measurement using a compact neutron source

机译:使用紧凑型中子源内部纹理测量

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In order to improve the instrumental accessibility of neutron diffraction techniques, many emerging compact neutron sources and in-house neutron diffractometers are being developed, even though the precision level of neutron diffraction experiments performed on such instruments was thought to be incomparable with that of large-scale neutron facilities. As a challenging project, the RIKEN accelerator-driven compact neutron source (RANS) was employed here to establish the technical environment for texture measurements, and the recalculated pole figures and orientation distribution functions of an interstitial-free steel sheet obtained from RANS were compared with the results from another two neutron diffractometers well established for texture measurement. These quantitative comparisons revealed that the precise neutron diffraction texture measurement at RANS has been realized successfully, and the fine region division of the neutron detector panel is invaluable for improving the stereographic resolution of texture measurements. Moreover, through selectively using the parts of the obtained neutron diffraction patterns that exhibit good statistics, the Rietveld texture analysis improves the reliability of the texture measurement to a certain extent. These technical research results may accelerate the development of other easily accessible techniques for evaluation of engineering materials using compact neutron sources, and also help to improve the data-collection efficiency for various time-resolved scattering experiments at large-scale neutron facilities.
机译:为了提高中子衍射技术的仪器可达性,正在开发许多新一形的紧凑型中子源和内部中子衍射计,即使在这些仪器上进行的中子衍射实验的精确度被认为是无比的 - 尺度中子设施。作为一个具有挑战性的项目,这里采用RIKEN加速器驱动的紧凑型紧凑的中子源(RAN)来建立纹理测量的技术环境,并将从RAN获得的间隙钢板进行重新计算的钢板图和取向分布功能进行了比较来自另外两个中子衍射计的结果,适用于纹理测量。这些定量比较显示,RAN的精确中子衍射纹理测量已经成功实现,中子探测器面板的精细区域分割对于改善纹理测量的立体分辨率是无价的。此外,通过选择性地使用所获得的中子衍射图案的部件表现出良好的统计数据,RIETVELD纹理分析在一定程度上提高了纹理测量的可靠性。这些技术研究结果可以加速使用紧凑型中子源评估工程材料的其他易于获取技术的发展,并有助于提高大型中子设施各种时间分散散射实验的数据收集效率。

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