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Shell thickness determination for PTFE-PS core-shell nanoparticles using scanning transmission X-ray microscopy (STXM)

机译:使用扫描透射X射线显微镜(STXM)PTFE-PS核 - 壳纳米粒子的壳厚度测定(STXM)

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摘要

A scanning transmission X-ray microscopy (STXM)-based methodology is introduced for determining the dimensions (shell thickness, core and total diameter) of core-shell nanoparticles, which exhibit a strong X-ray absorption contrast and a well-defined interface between core and shell material. A low radiation dosage during data acquisition and, therefore, less X-ray beam-induced damage of the sample is achieved by recording STXM images only at 2 predetermined energies of maximum absorption contrast, instead of recording a stack of images across the whole absorption edge. A model core-shell nanoparticle, polytetrafluoroethylene (PTFE) cores with polystyrene (PS) shell, is used for demonstration. Near-edge X-ray absorption fine structure spectroscopy confirms the significant difference in X-ray absorption behavior between PTFE and PS. Additionally, because of the insolubility of styrene in PTFE a well-defined interface between particle core and shell is expected. To validate the STXM results, both the naked PTFE cores as well as the complete core-shell nanoparticles are examined by scanning electron microscopy (SEM). The introduced STXM-based methodology yields particle dimensions in agreement with the SEM results and provides additional information such as the position of the particle core, which cannot be extracted from a SEM micrograph.
机译:引入扫描透射X射线显微镜(STXM)的基础方法,用于确定核心壳纳米颗粒的尺寸(外壳厚度,核心和总直径),其表现出强大的X射线吸收对比度和明确定义的界面核心和壳材料。数据采集​​期间的低辐射剂量,因此,通过仅在最大吸收对比度的2个预定能量的2预定能量下记录STXM图像,而不是在整个吸收边缘上记录一堆图像来实现样品的较少的X射线波束引起的样品损伤。 。使用聚苯乙烯(PS)壳的模型核 - 壳纳米粒子,聚四氟乙烯(PTFE)芯,用于演示。近边X射线吸收细结构光谱证实PTFE和PS之间的X射线吸收行为的显着差异。另外,由于PTFE中苯乙烯的不溶性,预期颗粒芯和壳之间的明确定义的界面。为了验证STXM结果,通过扫描电子显微镜(SEM)检查裸PTFE核以及完整的核 - 壳纳米粒子。介绍的STXM基础方法与SEM结果一致地产生粒子尺寸,并提供诸如颗粒芯的位置之类的附加信息,这些信息不能从SEM显微照片中提取。

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