>X‐ray photoelectron spectroscopy (XPS) is a widely used surface analysis technique employed in fundamental research'/> XPSSurfA: An open collaborative XPS data repository using the CMSShub platform
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XPSSurfA: An open collaborative XPS data repository using the CMSShub platform

机译:XPSSurfa:使用CMSShub平台开放的协作XPS数据存储库

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>X‐ray photoelectron spectroscopy (XPS) is a widely used surface analysis technique employed in fundamental research, applied research, service laboratories, and industry. Good‐quality analytical outcomes depend critically on spectral references. Many examples of XPS reference databases exist, including print editions, sets of spectral peak positions drawn from the literature, and digital archives and libraries. We report the development of a new digital XPS database comprising survey spectra and region spectra for a range of materials types, collected under a common set of analytical conditions. Each material is described using spectra collected at multiple pass energies with all photoelectron and X‐ray induced Auger transitions represented. Detailed metadata are provided for each material and each spectrum, presented using a schema that incorporates the ISO 16243 and 14976 standards and extensions developed in this work. Spectra are shared under a Creative Commons International (4.0) attribution, non‐commercial licence (CC BY‐NC) in Kratos (.dset), VAMAS (.vms), and XML (.xml) formats. It is intended that reference spectra be imported directly into XPS data analysis software packages for reference and comparison purposes, matching either the peak or transition of interest and the instrument pass energy. The database is flexible and scalable in structure and has the potential to become a core XPS reference resource.
机译: > X射线光电子能谱(XPS)是一种广泛使用的表面分析技术采用基础研究,应用研究,服务实验室和行业。优质的分析结果批判性地依赖于光谱参考。存在XPS参考数据库的许多示例,包括打印版本,从文献中汲取的频谱峰值位置,以及数字档案和库。我们报告了一种新的数字XPS数据库,包括测量光谱和区域光谱,用于一系列材料类型,在一套常见的分析条件下收集。使用在多次通过能量上收集的光谱来描述各种材料,其中所有光电子和X射线引起的螺旋延长螺旋过渡。使用包含ISO 16243和14976标准和在本工作中开发的标准和扩展的模式提供了详细的元数据。 Spectra在Creative Commons International(4.0)归属,非商业许可(CC By-NC)中共享,在Kratos(.dset),VAMAS(.vms)和XML(.xml)格式中。它旨在将参考光谱直接导入XPS数据分析软件包以供参考和比较目的,匹配兴趣的峰值或转换和仪器通过能量。数据库在结构中灵活且可伸缩,具有潜力成为核心XPS参考资源。

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