NON-DESTRUCTIVE DEFECT DETECTION OF APPLES BY SPECTROSCOPIC AND IMAGING TECHNOLOGIES: A REVIEW

摘要

Apples are susceptible to a wide range of defects that can occur in the orchard and during the post-harvest period. Detection of these defects by non-destructive sensing techniques is of great importance for the apple industry and has been an intensive research topic over the past two decades. This review presents an overview of common defects in apples, encompassing physiological disorders, mechanical damage, pathological disorders, and contamination. Presented and discussed in this review is research progress on the detection of defects in apples using various non-destructive spectroscopic and imaging techniques, including visible/near-infrared spectroscopy, fluorescence spectroscopy and imaging, monochromatic and color imaging, hyperspectral and multispectral imaging, x-ray imaging, magnetic resonance imaging, thermal imaging, time-resolved and spatially resolved spectroscopy, Raman spectroscopy, biospeckle imaging, and structured- illumination reflectance imaging. This review concludes with remarks on the prospects of these techniques and research needs in the future.