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Internal Oxidation of Textured Thin Tapes of Binary Copper-Based Alloys

机译:二元铜基合金纹理薄带的内部氧化

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Transmission electron microscopy was used to perform a structural analysis of a number of binary copper alloys with 3d transition elements after short-term annealing in an oxidative atmosphere (5 and 30min) at a temperature of 700 degrees C. It has been established that the textured tapes of Cu-Cr and Cu-Fe alloys sustain not only surface oxidation in the process of additional annealing, but also internal oxidation. Electron diffraction analysis has shown that a layer of complex spinel-type CuM2O4 oxide (M = Cr, Fe) forms on alloying element particles under annealing, while the precipitation of dispersed copper oxides, predominantly, Cu2O with a small admixture of CuO occurs in the copper matrix. Microhardness analysis has demonstrated that internal oxidation in the tapes of the studied binary alloys does not have an adverse effect on their mechanical properties.
机译:透射电子显微镜用于在氧化气氛(5和30min)的短期退火后,在700℃的温度下进行三种二元铜合金的结构分析。已经确定了纹理的 Cu-Cr和Cu-Fe合金的胶带不仅在额外的退火过程中不仅维持表面氧化,而且在内部氧化过程中维持表面氧化。 电子衍射分析表明,在退火下的合金元素颗粒上形成一层复合尖晶石型CUM2O4氧化物(M = Cr,Fe),而分散的铜氧化物的沉淀,主要是Cuo的小混合物的Cu 2O。 铜矩阵。 微硬度分析表明,所研究二元合金的胶带内的内部氧化对其机械性能没有不利影响。

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