Enhanced ferroelectric properties and energy storage density in PLZT/BNKT heterolayered thin films prepared by sol-gel method

摘要

The PLZT/BNKT heterolayered thin films on Pt/Ti/SiO2/Si substrates were fabricated by chemical solution deposition. The influence of different heterolayered structures on the microstructures, ferroelectric and energy storage properties of the films was investigated and clarified in detail. Based on the heterolayered structures, ferroelectric properties and energy storage density (J(reco)) of the films were significantly enhanced. The maximum polarization (P-max) and P-max-P-r get the maximum values of 71.4 C/cm(2) and 56.7 C/cm(2), respectively. The extreme value of recoverable energy storage density was 8.1 J/cm(3) for the heterolayered film S(7-1). These results demonstrate that the PLZT/BNKT heterolayered films are real potential candidates for electrostatic energy storage devices that are environment-friendly.