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首页> 外文期刊>Technical physics letters: Letters to the Russian journal of applied physics >Mass-Spectrometric Observation of C+ Ions during Electrospray with In-Source Atomization
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Mass-Spectrometric Observation of C+ Ions during Electrospray with In-Source Atomization

机译:电喷雾过程中C +离子的质谱观察源极雾化

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Carbon C+ ions formed in a mass-spectrometric electrospray source with controlled in-source fragmentation and atomization interface have been observed for the first time. The measurements were performed in a special MI-20 LowMass mass spectrometer (MS-Bio LLC) using aqueous methanol solutions of lithium and beryllium salts. The peak of C+ ions was substantially broadened as compared to the peaks of metal ions. A model is proposed that explains the formation of C+ ions due to charge exchange immediately at the high-vacuum boundary near the skimmer output.
机译:首次观察到在具有受控的源自碎片和雾化界面的质谱电气喷雾源中形成的碳C +离子。 使用锂和铍盐的甲醇溶液在特殊的MI-20低级质谱仪(MS-BIO LLC)中进行测量。 与金属离子的峰相比,C +离子的峰基本上扩大。 提出了一种模型,其解释了由于在撇渣器输出附近的高真空边界处立即电荷交换而形成的C +离子。

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