Three-Dimensional Aberration Analyses of Metasurface Flat Lenses

摘要

Three-dimensional analyses of optical aberrations of metasurface flat lenses are presented via ray tracing. The ray tracing is performed on the basis of anomalous refraction/reflection law specialized for metasurface instead of conventional Snell law. Relationship between spherical aberration and working distance, feature of chromatic aberration, astigmatism in meridian, and sagittal directions are analyzed numerically to fully reveal the aberration characteristics. Through the curve descriptions of geometric point spread function (PSF) and the modulation transfer function (MTF), the influence of monochrome aberration on the metasurface flat lenses is fully demonstrated. The results of the design model are instructive for the application of the metasurface flat lense-based high quality optical systems theoretically.