Peculiarities of the Short-Pulse Dielectric Strength of Vacuum Insulation

摘要

Results of a study of the short-pulse dielectric strength of millimeter plane vacuum gaps with electrodes that have been treated with an electron beam are presented. It is shown that the electric field strength of the first breakdown of vacuum gaps with pure metal electrodes is determined to a significant extent by the crystal structure of the metal. The development of the first short-pulse breakdown is accompanied by a very abrupt growth of the electric current. The short duration of the test pulses rules out the influence of all well-known inertial mechanisms of breakdown with characteristic action times greater than 20 ns. Some general assumptions regarding the nature of the factors stimulating the short-pulse breakdown of vacuum gaps are considered.