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首页> 外文期刊>SID International Symposium: Digest of Technology Papers >A Novel HVA Curing Wires Design Using Switch TFT to Reduce Curing Pads for Gate Driver on Array Liquid Crystal Display
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A Novel HVA Curing Wires Design Using Switch TFT to Reduce Curing Pads for Gate Driver on Array Liquid Crystal Display

机译:使用开关TFT进行新型HVA固化线设计,以减少阵列液晶显示器上的栅极驱动器的固化焊盘

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摘要

We report a novel HVA curing wires design using switch TFTs for optimizing space utilization in gate driver on array display. HVA curing pads can be reduced from 288 to 48 using this new design. The test mask with this new design complete Array test and HVA curing process successfully. The switch TFT's I-V characteristic and Array test/HVA curing conditions were discussed in this study.
机译:我们通过开关TFT报告一种新型HVA固化电线设计,用于在阵列显示屏上优化栅极驱动器中的空间利用率。 HVA固化焊盘可以使用这种新设计从288到48减少。 测试掩码具有此新设计的完整阵列测试和HVA固化过程。 本研究讨论了开关TFT的I-V特性和阵列测试/ HVA固化条件。

著录项

  • 来源
  • 作者单位

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

    Shenzhen China Star Optoelectronics Semiconductor Display Technology Co. Ltd;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 通信理论;
  • 关键词

    GOA; HVA Curing; Switch TFT;

    机译:果阿;什么固化;切换TFT;

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