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Measurements of L alpha, L beta, L gamma and M X-ray production cross sections of Os, Ir and Pt by low-energy electron impact: Comparisons of experiment with theory

机译:低能量电子影响的Oα,Lβ,Lγ和M X射线生产横截面的测量结果,IR和PT:理论的实验比较

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Experimental determinations of L alpha, L beta, L gamma and M X-ray production cross sections and their ratios for Os (Z=76), Ir (Z=77) and Pt (Z=78) by electron impact at incident energies of 6 similar to 30 keV are presented. Thin films of the studied elements deposited on thick carbon substrates were employed as targets in the experiments. Enhancements in L- and M-shell characteristic X-ray production due to electron-scattering effects in the double-layer structure target were corrected by means of Monte Carlo simulations. Comparisons were made between the measured L alpha, L beta, L gamma and M X-ray production cross sections and their ratios with the DWBA and PWBA-C-Ex theories and with other experimental data in the literature. In the case of L-subshells, the measured data of Os and Pt agree well with the theoretical values within the experimental uncertainties, but appreciable discrepancies between the experiment and theory exist for Ir; in the case of the M-shell, measured data for Ir show good agreement with theoretical values within the experimental uncertainties, but the measured results are somewhat lower than the theoretical values for Os and Pt. Finally, possible factors that could affect the comparisons between experiment and theory on cross-section ratios are discussed.
机译:通过电子冲击在入射能中的Lα,Lβ,Lγ和M X射线产生横截面及其对OS(Z = 76),IR(Z = 77)和Pt(Z = 78)的比率的实验测定6类似于30 keV的6。沉积在厚碳基材上的研究元素的薄膜被用作实验中的靶标。通过蒙特卡罗模拟校正了由于双层结构目标中的电子散射效果导致的L-和M壳特征X射线产生的增强。在测量的Lα,Lβ,Lγ和M X射线产生横截面和它们的比较与DWBA和PWBA-C-EX理论以及文献中的其他实验数据之间进行了比较。在L-子壳的情况下,OS和PT的测量数据与实验不确定因素内的理论值相得益彰,但实验和理论之间的明显差异存在于IR;在M-shell的情况下,IR的测量数据与实验不确定因素内的理论值显示出良好的一致性,但测量结果略微低于OS和Pt的理论值。最后,讨论了可能影响实验与横截面比率之间的比较的可能因素。

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