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Influence of two-level defects on the transmission of a microwave signal in an open coplanar waveguide

机译:双层缺陷对开放式共面波导中微波信号传输的影响

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Microwave superconducting quantum circuits are strongly affected by various defects that are unavoidable during the production process. This paper presents a new method for measuring losses in an open transmission line. This line interacts through a capacitive coupling with a coplanar quarter-wavelength resonator, which is used to study losses therein. The authors have investigated the dependencies of losses on power and temperature (in the millikelvin range). It has been shown that major losses in a transmission line are due to the interaction of a microwave field with defects which are effectively described by two-level systems. Published under license by AIP Publishing.
机译:微波超导量子电路受到在生产过程中不可避免的各种缺陷的强烈影响。 本文介绍了一种新方法,用于测量开放传输线中的损耗。 该线通过具有与共面四分之一波长谐振器的电容耦合交互,用于研究其中的损耗。 作者研究了电力和温度损失的损失(在Millikelvin范围内)。 已经表明,传输线中的主要损耗是由于微波场与两级系统有效描述的缺陷的相互作用。 通过AIP发布根据许可发布。

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