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首页> 外文期刊>Molecular crystals and liquid crystals >Influences of MgO Thicknesses Variation on Degradation Characteristics during Long-term Discharge in Microdischarge Cells
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Influences of MgO Thicknesses Variation on Degradation Characteristics during Long-term Discharge in Microdischarge Cells

机译:MgO厚度变化对微水池细胞长期放电期间降解特性的变化

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摘要

This paper investigates the changes in the surface and discharge characteristics during long-term (1000-hour) discharge in microdischarge cells with MgO crystal powders as a parameter of the MgO thickness variation. For four different MgO thicknesses (2500, 3500, 4500, and 5500 angstrom), the changes in the MgO surfaces were monitored by the SEM, and X-ray diffraction (XRD), and the resultant changes in the discharge characteristics such as the firing voltage and address delay time were also examined during the long-term (1000-hour) discharge. When increasing the MgO thickness ranging from 2500 to 5500 angstrom, it was observed that the grain size increased and (111) peak was intensified. Also, after 1000-hour discharge, it was observed that the firing voltage increased slightly with an increase in the MgO thickness, whereas the address discharge delay decreased with an increase in the MgO thickness.
机译:本文研究了使用MgO晶体粉末的长期(1000小时)放电期间的表面和放电特性的变化作为MgO晶体粉末作为MgO厚度变化的参数。 对于四种不同的MgO厚度(2500,3500,4500和5500埃),通过SEM和X射线衍射(XRD)监测MgO表面的变化,并且所得的放电特性(例如烧制)的所得到的变化 在长期(1000小时)放电期间还检查了电压和地址延迟时间。 当增加2500至5500埃的MgO厚度时,观察到晶粒尺寸增加(111)峰被加剧。 而且,在1000小时的放电之后,观察到燃烧电压随MgO厚度的增加而略微增加,而在MgO厚度的增加随着MgO厚度的增加而降低了地址放电延迟。

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