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Automatic detection and high resolution fine structure analysis of conic X-ray diffraction lines

机译:圆锥形X射线衍射线的自动检测和高分辨率精细结构分析

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摘要

The presented method demonstrates a first step in the development of a high resolution "Residual stress microscope" and facilitates through the implementation of largely automated procedures a fast detection of diffraction lines in the form of conic sections. It has been implemented for, but is not exclusively used for the Kossel technique and the "X-ray Rotation-Tilt Method" (XRT). The resulting multifaceted evaluable data base of many X-ray diffraction radiographies can be used not only for the systematic analysis of anomalies in diffraction lines (reflection fine structure), but also for direct calculation and output of precision residual stress tensors.
机译:提出的方法证明了开发高分辨率“残余应力显微镜”的第一步,并通过实施高度自动化的程序来帮助快速检测圆锥截面形式的衍射线。它已针对Kossel技术和“ X射线旋转倾斜方法”(XRT)实施,但并非专用于此。所得的许多X射线衍射射线照相的多方面可评估数据库不仅可用于衍射线(反射精细结构)异常的系统分析,还可用于直接计算和输出精确残余应力张量。

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