XRSW-Based Structure-Sensitive X-ray Spectroscopy of Condensed Matter

摘要

The method of studying condensed matter based on X-ray standing waves is described. The method's advantages include its numerous modifications and the possibility to extract mutually complementing specific information by using different channels of inelastic scattering. Various modifications of the method are developed in detail, including measurement of the photoelectron and fluorescent quanta yield and photoelectromotive force. The possible use of Compton scattering and thermal diffuse scattering (TDS) in the studies of electronic vibrational and optical properties of solids is analyzed and examined experimentally as well as the possibilities of the structural studies under the conditions of multibeam diffraction. The method for studying the structure of layer organic and inorganic nanostructures based on the use of long-period X-ray standing waves is suggested. A unique apparatus for measuring inelastic-scattering channels under the conditions of X-ray diffraction is designed and constructed.