Novel approaches to analysis of transition processes identification error by probability-statistical methods during sudden symmetric short-circuit tests of synchronous machines

摘要

Probabilistic and statistical methods are developed for researching long transient processes in synchronous machines, occurring under the influence of various random factors. In particular, a new authentic method is explained. The method is oriented at minimizing the mean square error of approximation of the discrete statistical model of the transient component to the experimental data on a relatively long section of the discrete transition process. The model allows representing the found error in the form of a discrete surface in three dimensions.