AFM-Raman colocalization setup: Advanced characterization technique for polymers

摘要

The optimization of manufacturing processes and the investigation of polymer materials during their life cycle imply an extended knowledge of the physical and chemical properties of the material. To obtain colocalized chemical, morphological, and thermomechanical information on the same sample area, we have developed an innovative colocalized atomic force microscopy (AFM)-Raman setup and a sample preparation strategy using cryoultramicrotomy. The developed technique allows perfect cross-sectioning of thin membranes (10-300 mu m) without embedding avoiding chemical contamination. The opened surface is characteristic of the material's bulk properties and allows spectroscopic and near-field measurements without sample artifacts. Additionally, thin sections can be collected for complementary transmission electron microscopy.