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Use of a Dielectric as a Sensitive Element of an X-Ray Detector

机译:使用电介质作为X射线检测器的敏感元件

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摘要

An X-ray detector with a dielectric (KU1 optical glass) used as a sensitive element is described. Operation of the detector is based on the discovered effect of electric-field generation in a dielectric under exposure to radiation. The measurements were taken at the Angara-5-1 facility, at which the radiation source is megaampere Z-pinch plasma. It is shown that when the radiation power incident on the detector is approximately 1 MW/cm(2), the detector response is a few volts with a time resolution of 1-2 ns. This effect is thought to be caused by "hot" electrons induced by radiation in the dielectric. The estimates for these experimental conditions are presented.
机译:描述了使用用作敏感元件的电介质(Ku1光学玻璃)的X射线检测器。 检测器的操作基于在暴露于辐射的电介质中的电场产生的发现效果。 测量在Angara-5-1设施处拍摄,辐射源是兆柱Z-PINCH等离子体。 结果表明,当入射在检测器上的辐射功率约为1mW / cm(2)时,检测器响应是几伏,时间分辨率为1-2ns。 认为这种效果是由电介质辐射引起的“热”电子引起的。 提出了这些实验条件的估计。

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    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

    Troitsk Inst Innovat &

    Fus Res State Res Ctr Russian Federat Moscow 108840 Russia;

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