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首页> 外文期刊>Infrared physics and technology >Measurement performance analysis for a charge-coupled-device-based near-infrared multi-spectral pyrometer
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Measurement performance analysis for a charge-coupled-device-based near-infrared multi-spectral pyrometer

机译:基于电荷耦合器的近红外多光谱高温计的测量性能分析

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摘要

The handheld charge coupled device (CCD) spectrometer can detect emitted, reflected or transmitted light spectrum rapidly, and so it was widely used in the fields of scientific research and industrial applications. In this paper, based on a CCD array spectrometer, a multi-spectral pyrometer is also developed, and the dependence of the spectral radiation intensity and the analog to digital converter (ADC) counts is determined by means of a blackbody furnace. Meanwhile, the noise model of the multi-spectral pyrometer is established and the influences of the readout noise, photoelectron noise and dark noise on temperature measurement accuracy are evaluated quantitatively. Experimental results show that temperature measurement accuracy is mainly affected by the readout noise. In the temperature range from 800 degrees C to 1200 degrees C and the near-infrared region around the spectral band of 780-1030 nm, the maximum relative temperature measurement deviation caused by the readout noise is 1.79% when the exposure time is set to 9 ms. And under the same setting conditions, the maximum relative temperature measurement deviation caused by the photoelectron noise and the dark noise is 1.00% and 0.24%, respectively.
机译:手持电荷耦合器件(CCD)光谱仪可以快速检测发射,反射或透射光谱,因此它广泛用于科学研究和工业应用领域。本文基于CCD阵列光谱仪,还开发了多光谱高温计,并且光谱辐射强度和模数转换器(ADC)计数的依赖性通过黑体炉确定。同时,定量评估了读出噪声,光电子噪声和暗噪声对温度测量精度的影响的噪声模型。实验结果表明,温度测量精度主要受读出噪声的影响。在800℃至1200摄氏度的温度范围内,在780-1030nm的光谱带周围的近红外区域,当曝光时间设定为9时,由读出噪声引起的最大相对温度测量偏差为1.79%多发性硬化症。在相同的设定条件下,光电子噪声和暗噪声引起的最大相对温度测量偏差分别为1.00%和0.24%。

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