Spectroscopic Characterization of Dental Ceramics Composed of Yttrium-Stabilized Zirconium

摘要

Yttria-zirconia ceramics in various compositions of Y2O3 and SiO2 were synthesized by a high temperature solid state reaction process in alumina crucibles at 1400 degrees C for 2h. The obtained samples were characterized by X-ray diffraction, infrared spectroscopy and X-ray absorption near edge structure analysis. Combining all of the structural characterizations, we conclude that the addition of lower Y2O3 and SiO2 contents induces structural changes in the host matrix without partially or/and fully stabilizing the lattice of the zirconia crystalline phase.