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Effect of current sweep rate on critical current of superconducting Ag-Bi-2223 tapes

机译:电流扫描速率对Ag-Bi-2223超导带临界电流的影响

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The effect of sweep rate of applied current (dl/dt) on critical current (I-c) of Ag-sheathed Bi2PbxSr2-xCa2Cu3Oy (Ag-Bi-2223) tapes was studied by the four-probe measurement method of V-l curves. It was found that the V-l curves were affected apparently by dl/dt, resulting I-c, decreases with increasing dl/dt for all critical current criterions used here. This result implies that the I-c determined at very large dl/dt supplied, for example, by the pure current system will be significantly smaller than the I-c measured at small dl/dt usually used in the d.c. method. The possible influences of the present results on published V-l data and I-c measurement technique are discussed. We have shown that the ohmic heat at the current contact leads of our Ag-sheathed Bi-2223 samples immersed in liquid nitrogen is negligible. (C) 1998 Elsevier Science Ltd. All rights reserved. [References: 10]
机译:通过V-1曲线的四探针测量方法研究了施加电流的扫描速率(dl / dt)对装有Ag的Bi2PbxSr2-xCa2Cu3Oy(Ag-Bi-2223)带的临界电流(I-c)的影响。已经发现,对于这里使用的所有关键电流标准,dl / dt明显影响了V-1曲线,导致I-c随着dl / dt的增加而减小。该结果意味着,例如,由纯电流系统提供的在非常大的dl / dt下确定的I-c将大大小于通常在dc中使用的在小dl / dt下测量的I-c。方法。讨论了当前结果对已发布的V-1数据和I-c测量技术的可能影响。我们已经证明,浸入液氮中的带Ag护套的Bi-2223样品的电流接触引线上的欧姆热量可以忽略不计。 (C)1998 Elsevier ScienceLtd。保留所有权利。 [参考:10]

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