Meet Our Editorial Board Member

摘要

Prof. Joung Real Ahn obtained a doctorate (Ph.D.) in Physics from POSTECH, Pohang, Republic of Korea. Prof. Joung Real Ahn is a professor in Sungkyunkwan University, Suwon, Republic of Korea. He has extensive experience in the growth of quantum materials such quantum wires (ID) and layers (2D) and 3D quantum surface architecture and photoemission experiments including angle-resolved photoemission spectroscopy and X-ray photoemission spectroscopy, and in diffraction experiments including X-ray diffraction and low energy electron diffraction. He is well known in this research field, and has published numerous papers in world-leading journals, including Science (2014), Nano Letters (2015), ACS Nano (2014, 2013), Journal of American Chemical society (2006), and Physical Review Letters (2005, 2004, 2003, 2002, 2000). In particular, he recently achieved a break-through in materials science based on spectroscopy and the diffraction experiments: wafer-scale single-crystal growth of graphene (Science (2014)), 3D carbon architecture (ACS Nano (2014)), and direct observation of one-dimensional semiconductor wire with a size below 1 nm (Nano Letters (2015)]. He also has an experience of a home-built STM system, called an inelastic-electron-tunneling-spectroscopy (IETS) STM system operating at 4 K, and fabrications of FET devices.