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New high performance computed radiography phosphor imaging plates from GE

机译:GE的新型高性能计算机射线照相荧光粉成像板

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摘要

With the introduction of a new IPU series of phosphor imaging plates, GE Sensing & Inspection Technologies now provides a comprehensive portfolio of imaging plates covering virtually allnon-destructive testing (NDT) applications for computed radiography. The new IPU plates offer excellent sharpness and the best probability of detection in the GE portfolio, while maintaining the same high level of productivity. They are designed for highly critical, specialist applications involving castings and weld inspection in the aerospace, oil and gas, power generation and automotive sectors.
机译:随着新IPU系列荧光粉成像板的推出,GE传感与检测技术公司现在提供了全面的成像板产品组合,涵盖了用于计算机射线照相的几乎所有非破坏性测试(NDT)应用。新型IPU板在GE产品组合中具有出色的清晰度和最佳的检测概率,同时保持了相同的高生产率。它们设计用于高度关键的专业应用,涉及航空航天,石油和天然气,发电和汽车领域的铸件和焊接检查。

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