首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Improved unipolar resistive switching characteristics of Au-doped nickel ferrite magnetic thin films for nonvolatile memory applications
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Improved unipolar resistive switching characteristics of Au-doped nickel ferrite magnetic thin films for nonvolatile memory applications

机译:改善非易失性存储器应用的Au掺杂镍铁氧体磁性薄膜的单极电阻切换特性

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Au-doped nickel ferrite (NiFe2O4-Au, NFO-Au) magnetic thin films were prepared on Pt/Ti/SiO2/Si substrates by a chemical solution deposition method to explore the effect of Au doping on unipolar resistive switching (RS) behavior. Experimental results reveal that 1% Au doped NFO film demonstrated considerably optimum switching parameters such as lower electroforming voltage, narrow distribution of SET/RESET voltages, good cycle-to-cycle endurance (10(3) cycles) and long data retention (10(5) s at 125 degrees C) as compared to NFO and Au-(0.5% and 2%) doped NFO films. The improved performance is attributed to suppressing of randomness of oxygen vacancies based filament by Au doping. Current transport conduction mechanisms are found to be Ohmic in low resistance state and Schottky emission in high resistance state. Physical model concerns for the rupture and formation of Au atoms assisted conductive filament inside the Au-doped NFO films based on the thermal effect of oxygen vacancies. Magnetic properties correlated with RS were measured and analyzed. The variation of saturation magnetization with different resistance state may be attributed to Au-doping induced different oxygen vacancies concentrations and make the conversion of valence states of Fe3+ and Fe2+ ions in octahedral sites easier. Our results provide a pathway towards the applications in nonvolatile RS memory and magneto-electronic coupling devices. (C) 2017 Elsevier B.V. All rights reserved.
机译:通过化学溶液沉积方法在Pt / Ti / SiO 2 / Si衬底上制备Au-掺杂的镍铁氧体(NiFe2O4-Au,NFO-Au)磁性薄膜,以探讨Au掺杂对单极电阻切换(RS)行为的影响。实验结果表明,1%Au掺杂NFO薄膜显示出相当大的最佳开关参数,如较低的电铸电压,窄的设定/复位电压分布,良好的循环到循环耐久性(10(3)个循环)和长数据保留(10( 5)与NFO和Au-(0.5%和2%)掺杂NFO薄膜相比,5)在125℃下。改进的性能归因于Au掺杂的基于丝的氧空位随机性抑制。发现电流传输传导机构在高电阻状态下是低电阻状态和肖特基发射的欧姆。基于氧空位的热效应,物理模型对Au原子辅助导电长丝的破裂和形成的担忧。测量并分析磁性与RS相关的磁性。具有不同电阻状态的饱和磁化强度的变化可能归因于Au-掺杂诱导的不同氧空位浓度,并使八面体位点的Fe3 +和Fe2 +离子的价态转化更容易。我们的结果为非易失性RS存储器和磁电子耦合装置提供了一种途径。 (c)2017年Elsevier B.V.保留所有权利。

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