Photon-induced anion emission: A mechanism for ion-induced secondary-electron emission from an Al/O surface

摘要

The results of experiments that investigate photon-induced desorption of O- from an oxygen-exposed aluminum surface are reported. The probability of O- emission exhibits a maximum for photon energies in the vicinity of 8.7 eV. The observed photon-induced emission is compatible with a model previously invoked to describe low-energy, ion-induced secondary-electron emission from an Al/O system. [S0163-1829(98)04348-3]. [References: 14]