We probe electric-field noise in a surface ion trap for ion-surface distances d between 50 and 300 μm in the normal and planar directions. We find the noise distance dependence to scale as d~(-2.6) in our trap and a frequency dependence which is consistent with 1/ f noise. Simulations of the electric-field noise specific to our trap geometry provide evidence that we are not limited by technical noise sources. Our distance scaling data is consistent with a noise correlation length of about 100 μm at the trap surface, and we discuss how patch potentials of this size would be modified by the electrode geometry.
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