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首页> 外文期刊>Physica, B. Condensed Matter >Properties of transparent conducting tin monoxide(SnO) thin films prepared by chemical spray pyrolysis method
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Properties of transparent conducting tin monoxide(SnO) thin films prepared by chemical spray pyrolysis method

机译:通过化学喷雾热解法制备透明导电锡一氧化铁(SnO)薄膜的性质

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摘要

AbstractTransparent conducting Stannous Oxide (SnO) thin films were obtained by chemical spray pyrolysis method on glass substrates for 0.1?M and 0.25?M concentration of precursor solutions. Their structural, morphological, optical and electrical properties were investigated. X-ray diffraction (XRD) study shows polycrystalline nature of the films with orthorhombic crystal structure. The morphological analysis was carried out by Scanning electron microscopy (SEM) and elemental analysis was done by Energy dispersive X-ray spectroscopy (EDX). The band gap of 0.1?M and 0.25?M thin film samples were found to be 3.58eV with 82% transmission and 3?eV with 30% transmission respectively. The film thickness, refractive index (n) and extinction coefficient (k) of the films were obtained by ellipsometric technique. Hall effect measurements reveal p-type conduction with mobility 7.8 cm2V?1s?1and 15 cm2V?1s?1and conductivity of 8.5?S/cm and 17.1?S/cm respectively for the 0.1?M and 0.25?M samples. Photoluminescence (PL) spectrum of the samples show a broad emission which covers near band edge (NBE) as well as deep level emission (DLE) in the region 380?nm-620?nm.]]>
机译:<![CDATA [ 抽象 通过化学喷雾热解法在玻璃基板上获得0.1Ω·m的透明导电类氧化物(SnO)薄膜和0.25米的前体溶液浓度。研究了它们的结构,形态,光学和电性能。 X射线衍射(XRD)研究表明,具有正交晶体结构的膜的多晶性质。通过扫描电子显微镜(SEM)进行形态学分析,通过能量分散X射线光谱(EDX)进行元素分析。波段间隙为0.1Ωm和0.25Ωm薄膜样品,薄膜样品为3.58EV,速率为3.58EV,分别具有30%的速度为82%。通过椭圆型技术获得薄膜的膜厚度,折射率(N)和消光系数(k)。霍尔效应测量显示P型传导与移动性7.8 cm 2 v ?1 s < ce:sup =“post”>?1 和15cm 2 v ?1 s ?1 和8.5·s / cm和17.1·s / cm的电导率分别为0.1≤m和0.25Ωm样品。样品的光致发光(PL)谱显示出覆盖带边缘(NBE)附近的广泛发射,以及区域380?NM-620Δnm的深层发射(DLE)。 ]]>

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