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Integration of 555 temperature sensors into a 64 x 192 CMOS image sensor

机译:将555个温度传感器集成到64 x 192 CMOS图像传感器中

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In this work, a novel approach for measuring relative temperature variations across the active area of a CMOS image sensor itself is presented. 555 Image pixels have been replaced by temperature sensors pixels (Tixels) in the same pixel array layer. Both sensors, pixels and Tixels, utilize the same readout structure to obtain the data. This approach of measuring temperature variations in the pixel array can be used to compensate for dark signal non-uniformity. Measurements of dark current and temperature have been performed in a temperature range of-40 and 90 degrees C. Results show that pixels and Tixels are working by using the same readout system based on source followers and column amplifiers. The average dark current of the image sensor increases with temperature in the temperature range of-40 and 60 degrees C, and at the same time, Tixels show high linear response, having a temperature error less than 0.6 degrees C after a 1st order best curve fitting. (C) 2018 Elsevier B.V. All rights reserved.
机译:在这项工作中,呈现了一种用于测量CMOS图像传感器本身的有效区域上的相对温度变化的新方法。 555图像像素已被同一像素阵列层中的温度传感器(Zixels)取代。传感器,像素和讽刺都使用相同的读出结构来获得数据。这种测量像素阵列中温度变化的这种方法可用于补偿暗信号不均匀性。暗电流和温度的测量已经在-40和90摄氏度的温度范围内进行。结果表明像素和讽刺通过使用基于源追随者和柱放大器的相同读出系统进行工作。图像传感器的平均暗电流随温度的温度范围内的温度范围为-40和60摄氏度,同时,齐杉显示出高线性响应,在1阶最佳曲线之后具有小于0.6℃的温度误差配件。 (c)2018年elestvier b.v.保留所有权利。

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