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Integrated broadband dual-polarization Ge-rich SiGe mid-infrared Fourier-transform spectrometer

机译:集成宽带双极化GE丰富有的SIGE中红外傅里叶变换光谱仪

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摘要

Miniaturized on-chip spectrometers covering a wide band of the mid-infrared spectrum have an immense potential for multi-target detection in high-impact applications, such as chemical sensing or environmental monitoring. Specifically, multi-aperture spatial heterodyne Fourier-transform spectrometers (SHFTS) provide high throughput and improved tolerance against fabrication errors, compared to conventional counterparts. Still, state-of-the-art implementations have only shown single-polarization operation in narrow bandwidths within the near and short infrared. Here, we demonstrate the first, to the best of our knowledge, dual-polarization ultra-wideband SHFTS working beyond 5 mu m wavelength. We exploit the unique flexibility in material engineering of the graded-index germanium-rich silicon-germanium (Ge-rich SiGe) photonic platform to implement a SHFTS that can be operated in an unprecedented range of 800 cm(-1), showing experimental resolution better than 15 cm(-1) for both orthogonal polarizations and free spectral range of 132 cm(-1), in the wavelength range between 5 and 8.5 mu m. (C) 2018 Optical Society of America
机译:覆盖着中红外光谱宽带的小型化片上光谱仪具有高抗冲应用中的多目标检测的巨大潜力,例如化学传感或环境监测。具体地,与传统对应物相比,多孔空间外差傅立叶变换光谱仪(SHFT)提供高通量和改善的对制造误差的耐受性。尽管如此,最先进的实施方式仅在近红外线内的窄带宽中示出了单极化操作。在这里,我们展示了首先,尽我们所知,双极化超宽带SHFT超过5亩波长。我们利用了富含分子富含锗硅 - 锗(GE富含SiGe)光子平台的材料工程中的独特灵活性,实现了可以在800厘米(-1)的前所未有的范围内操作的SHFT,显示实验分辨率对于正交偏振,在5至8.5μm之间的波长范围内,对于正交偏振和自由谱范围而优于15cm(-1),在132cm(-1)的自由谱范围内。 (c)2018年光学学会

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