Extraction of device S‐parameters within board by using a TRL de‐embedding technique

机译：通过使用TRL去嵌入技术提取板内的装置S参数

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Abstract >Semiconductor devices are tested within a complex environment including a loadboard and a socket. In this paper, we propose a calibration methodology and a RF de‐embedding technique that allows the extraction of the device parameters. This method is based on the utilization of several calibration elements inspired by the TRL method. This study has been applied on an active device and the results have been validated using a real test solution. </abstract> </span> <span class="z_kbtn z_kbtnclass hoverxs" style="display: none;">展开▼</span> </div> <div class="translation abstracttxt"> <span class="zhankaihshouqi fivelineshidden" id="abstract"> <span>机译：</span><Abstract XMLNS =“http://www.wiley.com/namespaces/wiley”type =“main”xml：lang =“en” <标题类型=“main”>抽象</ title> >半导体器件在包括载体和插座的复杂环境中进行测试。在本文中，我们提出了一种校准方法和RF去嵌入技术，允许提取器件参数。该方法基于利用由TRL方法启发的多个校准元件。本研究已应用于有源设备，并使用真实测试解决方案验证了结果。</ p> </摘要> </span> <span class="z_kbtn z_kbtnclass hoverxs" style="display: none;">展开▼</span> </div> </div> <div class="record"> <h2 class="all_title" id="enpatent33" >著录项</h2> <ul> <li> <span class="lefttit">来源</span> <div style="width: 86%;vertical-align: text-top;display: inline-block;"> <a href='/journal-foreign-24977/'>《Microwave and optical technology letters》</a> <b style="margin: 0 2px;">|</b><span>2018年第11期</span><b style="margin: 0 2px;">|</b><span>共5页</span> </div> </li> <li> <div class="author"> <span class="lefttit">作者</span> <p id="fAuthorthree" class="threelineshidden zhankaihshouqi"> <a href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=Hamze Kassem&option=202" target="_blank" rel="nofollow">Hamze Kassem;</a> <a href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=Pasquet Daniel&option=202" target="_blank" rel="nofollow">Pasquet Daniel;</a> <a href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=Descamps Philippe&option=202" target="_blank" rel="nofollow">Descamps Philippe;</a> <a href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=De Ledinghen Edouard&option=202" target="_blank" rel="nofollow">De Ledinghen Edouard;</a> </p> <span class="z_kbtnclass z_kbtnclassall hoverxs" id="zkzz" style="display: none;">展开▼</span> </div> </li> <li> <div style="display: flex;"> <span class="lefttit">作者单位</span> <div style="position: relative;margin-left: 3px;max-width: 639px;"> <div class="threelineshidden zhankaihshouqi" id="fOrgthree"> <p>Normandie Université ENSICAEN/CRISMAT/UMR6508Caen France;</p> <p>Presto Engineering EuropeFrance;</p> <p>Presto Engineering EuropeFrance;</p> <p>Normandie Université ENSICAEN/CRISMAT/UMR6508Caen France;</p> </div> <span class="z_kbtnclass z_kbtnclassall hoverxs" id="zhdw" style="display: none;">展开▼</span> </div> </div> </li> <li > <span class="lefttit">收录信息</span> <span style="width: 86%;vertical-align: text-top;display: inline-block;"></span> </li> <li> <span class="lefttit">原文格式</span> <span>PDF</span> </li> <li> <span class="lefttit">正文语种</span> <span>eng</span> </li> <li> <span class="lefttit">中图分类</span> <span><a href="https://www.zhangqiaokeyan.com/clc/1165.html" title="光学">光学;</a></span> </li> <li class="antistop"> <span class="lefttit">关键词</span> <p style="width: 86%;vertical-align: text-top;"> <a style="color: #3E7FEB;" href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=de‐embedding&option=203" rel="nofollow">de‐embedding;</a> <a style="color: #3E7FEB;" href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=industrial RF test&option=203" rel="nofollow">industrial RF test;</a> <a style="color: #3E7FEB;" href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=microwave&option=203" rel="nofollow">microwave;</a> <a style="color: #3E7FEB;" href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=semiconductor test&option=203" rel="nofollow">semiconductor test;</a> <a style="color: #3E7FEB;" href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=TRL&option=203" rel="nofollow">TRL;</a> </p> <div class="translation"> 机译：去嵌入;工业RF测试;微波;半导体测试;TRL; </div> </li> </ul> </div> </div> <div class="literature cardcommon"> <div class="similarity "> <h3 class="all_title" id="enpatent66">相似文献</h3> <div class="similaritytab clearfix"> <ul> <li class="active" >外文文献</li> <li >中文文献</li> <li >专利</li> </ul> </div> <div class="similarity_details"> <ul > <li> <div> <b>1. </b><a 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break-all;white-space: initial;text-overflow: initial;overflow: initial;"> <span>机译：通过使用TRL去嵌入技术提取板内的装置S参数</span> </p> </li> <li> <div> <b>2. </b><a class="enjiyixqcontent" href="/academic-journal-foreign_ieee-transactions-magnetics_thesis/02041141550.html">Parameter extraction for microwave devices based on 4SID techniques</a> <b>[J]</b> . <span> <a href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=Munteanu I.&option=202" target="_blank" rel="nofollow" class="tuijian_auth tuijian_authcolor">Munteanu I.,</a> <a href="/search.html?doctypes=4_5_6_1-0_4-0_1_2_3_7_9&sertext=Ioan D.&option=202" target="_blank" rel="nofollow" class="tuijian_auth tuijian_authcolor">Ioan D. </a> <a href="/journal-foreign-12/" target="_blank" rel="nofollow" class="tuijian_authcolor">IEEE Transactions on Magnetics .</a> <span>1999</span><span>,第3期</span> </span> </div> <p class="zwjiyix translation" style="max-width: initial;height: auto;word-break: break-all;white-space: initial;text-overflow: 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